Readout techniques for linearity and resolution improvements in MOSFET dosimeters
- Carvajal, M.A.
- Vilches, M.
- Guirado, D.
- Lallena, A.M.
- Banqueri, J.
- Palma, A.J.
ISSN: 0924-4247
Year of publication: 2010
Volume: 157
Issue: 2
Pages: 178-184
Type: Article