Contact resistance and saturation effects in the scanning tunnelling microscope: the resistance quantum unit

  1. Martín‐Rodero, A.
  2. Ferrer, J.
  3. Flores, F.
Aldizkaria:
Journal of Microscopy

ISSN: 1365-2818 0022-2720

Argitalpen urtea: 1988

Alea: 152

Zenbakia: 2

Orrialdeak: 317-323

Mota: Artikulua

DOI: 10.1111/J.1365-2818.1988.TB01392.X GOOGLE SCHOLAR