Contact resistance and saturation effects in the scanning tunnelling microscope: the resistance quantum unit

  1. Martín‐Rodero, A.
  2. Ferrer, J.
  3. Flores, F.
Journal:
Journal of Microscopy

ISSN: 1365-2818,  0022-2720

Year of publication: 1988

Volume: 152

Issue: 2

Pages: 317-323

Type: Article

DOI: 10.1111/J.1365-2818.1988.TB01392.X GOOGLE SCHOLAR
Data source: Scopus