Plasma profiling-time of flight mass spectrometry: considerations to exploit its analytical performance for materials characterization

  1. Muñiz, R.
  2. Lobo, L.
  3. Fernández, B.
  4. Pereiro, R.
Aldizkaria:
Journal of Analytical Atomic Spectrometry

ISSN: 1364-5544,  0267-9477

Argitalpen urtea: 2019

Alea: 34

Zenbakia: 4

Orrialdeak: 702-707

Mota: Artikulua

DOI: 10.1039/C8JA00334C GOOGLE SCHOLAR
Datuen iturria: Scopus