Surface x-ray diffraction analysis using a genetic algorithm: The case of Sn/Cu(100)-(3√2 × √2)R45°

  1. Martínez-Blanco, J.
  2. Joco, V.
  3. Quirós, C.
  4. Segovia, P.
  5. Michel, E.G.
Journal:
Journal of Physics Condensed Matter

ISSN: 0953-8984,  1361-648X

Year of publication: 2009

Volume: 21

Issue: 13

Type: Article

DOI: 10.1088/0953-8984/21/13/134011 GOOGLE SCHOLAR
Data source: Scopus