Surface x-ray diffraction analysis using a genetic algorithm: The case of Sn/Cu(100)-(3√2 × √2)R45°

  1. Martínez-Blanco, J.
  2. Joco, V.
  3. Quirós, C.
  4. Segovia, P.
  5. Michel, E.G.
Zeitschrift:
Journal of Physics Condensed Matter

ISSN: 0953-8984 1361-648X

Datum der Publikation: 2009

Ausgabe: 21

Nummer: 13

Art: Artikel

DOI: 10.1088/0953-8984/21/13/134011 GOOGLE SCHOLAR