Combined Near Edge X-ray Absorption Fine Structure and X-ray Photoemission spectroscopies for the study of amorphous carbon thin films

  1. Díaz, J.
  2. Anders, S.
  3. Zhou, X.
  4. Moler, E.J.
  5. Kellar, S.A.
  6. Hussain, Z.
Revista:
Journal of Electron Spectroscopy and Related Phenomena

ISSN: 0368-2048

Ano de publicación: 1999

Volume: 101-103

Páxinas: 545-550

Tipo: Artigo