Combined Near Edge X-ray Absorption Fine Structure and X-ray Photoemission spectroscopies for the study of amorphous carbon thin films
- Díaz, J.
- Anders, S.
- Zhou, X.
- Moler, E.J.
- Kellar, S.A.
- Hussain, Z.
Revista:
Journal of Electron Spectroscopy and Related Phenomena
ISSN: 0368-2048
Ano de publicación: 1999
Volume: 101-103
Páxinas: 545-550
Tipo: Artigo