Combined Near Edge X-ray Absorption Fine Structure and X-ray Photoemission spectroscopies for the study of amorphous carbon thin films

  1. Díaz, J.
  2. Anders, S.
  3. Zhou, X.
  4. Moler, E.J.
  5. Kellar, S.A.
  6. Hussain, Z.
Revista:
Journal of Electron Spectroscopy and Related Phenomena

ISSN: 0368-2048

Any de publicació: 1999

Volum: 101-103

Pàgines: 545-550

Tipus: Article

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Font de les dades: Scopus