Transverse Kerr magnetometry for the study of thin films presenting perpendicular and in-plane anisotropy

  1. Rivas, M.
  2. Calleja, J.F.
  3. Contreras, M.C.
Aldizkaria:
Journal of Magnetism and Magnetic Materials

ISSN: 0304-8853

Argitalpen urtea: 1997

Alea: 166

Zenbakia: 1-2

Orrialdeak: 53-58

Mota: Artikulua

DOI: 10.1016/S0304-8853(96)00429-5 GOOGLE SCHOLAR
Datuen iturria: Scopus