Transverse Kerr magnetometry for the study of thin films presenting perpendicular and in-plane anisotropy

  1. Rivas, M.
  2. Calleja, J.F.
  3. Contreras, M.C.
Journal:
Journal of Magnetism and Magnetic Materials

ISSN: 0304-8853

Year of publication: 1997

Volume: 166

Issue: 1-2

Pages: 53-58

Type: Article

DOI: 10.1016/S0304-8853(96)00429-5 GOOGLE SCHOLAR
Data source: Scopus