Publications dans lesquelles il/elle collabore avec PEDRO FERNANDEZ ALVAREZ (12)

2016

  1. Measurement and correction of the slope angle of flat surfaces digitized by a conoscopic holography system

    Precision Engineering, Vol. 46, pp. 369-376

2015

  1. Adjustment recommendations of a conoscopic holography sensor for a reliable scanning of surfaces with roughness grades obtained by different processes

    Precision Engineering, Vol. 42, pp. 335-345

  2. Influence of Surface Location within Depth of Field on Measuring by a Conoscopic Holography Sensor Integrated in a Machining Centre

    Procedia Engineering

  3. Influence of part material and sensor adjustment on the quality of digitised point-clouds using conoscopic holography

    Precision Engineering, Vol. 42, pp. 42-52

2014

  1. Influence of surface position along the working range of conoscopic holography sensors on dimensional verification of AISI 316 wire EDM machined surfaces

    Sensors (Switzerland), Vol. 14, Núm. 3, pp. 4495-4512

  2. Non-contact measurement of surface roughness by Conoscopic uolography systems

    Lecture Notes in Engineering and Computer Science

2012

  1. Integration of a conoscopic holography sensor on a CMM

    AIP Conference Proceedings

2011

  1. Development of a virtual machine for the sheet metal bending process simulation for educational purposes

    Materials Science Forum

2009

  1. Influence of surface material on the quality of laser triangulation digitized point clouds for reverse engineering tasks

    ETFA 2009 - 2009 IEEE Conference on Emerging Technologies and Factory Automation

2008

  1. Accessibility analysis for automatic inspection in CMMs by using bounding volume hierarchies

    International Journal of Production Research, Vol. 46, Núm. 20, pp. 5797-5826

  2. Laser scan planning based on visibility analysis and space partitioning techniques

    International Journal of Advanced Manufacturing Technology, Vol. 39, Núm. 7-8, pp. 699-715

2006

  1. Accessibility analysis for automatic inspection using bounding volume hierarchies

    IEEE International Conference on Emerging Technologies and Factory Automation, ETFA