GRUPO DE NANOCIENCIA
UONANO
Oak Ridge National Laboratory
Oak Ridge, Estados UnidosPublicaciones en colaboración con investigadores/as de Oak Ridge National Laboratory (2)
2013
-
Influence of RF-sputtering power on formation of vertically stacked Si
1-x
Ge
x
nanocrystals between ultra-thin amorphous Al
2
O
3
layers: Structural and photoluminescence properties
Journal of Physics D: Applied Physics, Vol. 46, Núm. 38
2011
-
Compositional analysis with atomic column spatial resolution by 5th-order aberration-corrected scanning transmission electron microscopy
Microscopy and Microanalysis, Vol. 17, Núm. 4, pp. 578-581