Focused electron beam induced deposition of magnetic tips for improved magnetic force microscopy
- Escalante-Quiceno, A.T.
- Fernández, V.V.
- Martín, J.I.
- Hierro-Rodriguez, A.
- Hlawacek, G.
- Jaafar, M.
- Asenjo, A.
- Magén, C.
- De Teresa, J.M.
ISSN: 1816-0328, 0132-6414
Année de publication: 2024
Volumen: 50
Número: 10
Pages: 919-927
Type: Article