Operando characterization of conductive filaments during resistive switching in Mott VO2

  1. Cheng, S.
  2. Lee, M.-H.
  3. Li, X.
  4. Fratino, L.
  5. Tesler, F.
  6. Han, M.-G.
  7. del Valle, J.
  8. Dynes, R.C.
  9. Rozenberg, M.J.
  10. Schuller, I.K.
  11. Zhu, Y.
Revista:
Proceedings of the National Academy of Sciences of the United States of America

ISSN: 1091-6490,  0027-8424

Any de publicació: 2021

Volum: 118

Número: 9

Tipus: Article

DOI: 10.1073/PNAS.2013676118 GOOGLE SCHOLAR lock_openAccés obert editor
Font de les dades: Scopus