Asymmetric electromigration-driven resistive switching in tunnel junctions

  1. Ventura, J.
  2. Teixeira, J.M.
  3. Araujo, J.P.
  4. Carpinteiro, F.
  5. Sousa, J.B.
  6. Zhang, Z.
  7. Liu, Y.
  8. Freitas, P.P.
Revue:
Journal of Non-Crystalline Solids

ISSN: 0022-3093

Année de publication: 2008

Volumen: 354

Número: 47-51

Pages: 5272-5274

Type: Article

DOI: 10.1016/J.JNONCRYSOL.2008.04.050 GOOGLE SCHOLAR
La source de données: Scopus