Bearing Fault Diagnosis With Envelope Analysis and Machine Learning Approaches Using CWRU Dataset
- Alonso-Gonzalez, M.
- Diaz, V.G.
- Lopez Perez, B.
- Cristina Pelayo G-Bustelo, B.
- Anzola, J.P.
Journal:
IEEE Access
ISSN: 2169-3536
Year of publication: 2023
Volume: 11
Pages: 57796-57805
Type: Article