Laser ablation inductively coupled plasma mass spectrometry for direct analysis of the spatial distribution of trace elements in metallurgical-grade silicon

  1. Pisonero, J.
  2. Kroslakova, I.
  3. Günther, D.
  4. Latkoczy, C.
Revista:
Analytical and Bioanalytical Chemistry

ISSN: 1618-2642,  1618-2650

Ano de publicación: 2006

Volume: 386

Número: 1

Páxinas: 12-20

Tipo: Achega congreso

DOI: 10.1007/S00216-006-0658-0 GOOGLE SCHOLAR
Fonte de datos: Scopus