Automated dynamic inspection using active infrared thermography

  1. Usamentiaga, R.
  2. Mokhtari, Y.
  3. Ibarra-Castanedo, C.
  4. Klein, M.
  5. Genest, M.
  6. Maldague, X.
Revue:
IEEE Transactions on Industrial Informatics

ISSN: 1551-3203

Année de publication: 2018

Volumen: 14

Número: 12

Pages: 5648-5657

Type: Article

DOI: 10.1109/TII.2018.2836363 GOOGLE SCHOLAR
La source de données: Scopus