Coverage-aware test database reduction

  1. Tuya, J.
  2. De La Riva, C.
  3. Suarez-Cabal, M.J.
  4. Blanco, R.
Revue:
IEEE Transactions on Software Engineering

ISSN: 0098-5589

Année de publication: 2016

Volumen: 42

Número: 10

Pages: 941-959

Type: Article

DOI: 10.1109/TSE.2016.2519032 GOOGLE SCHOLAR
La source de données: Scopus