Depth profile analysis of amorphous silicon thin film solar cells by pulsed radiofrequency glow discharge time of flight mass spectrometry

  1. Alvarez-Toral, A.
  2. Sanchez, P.
  3. Menéndez, A.
  4. Pereiro, R.
  5. Sanz-Medel, A.
  6. Fernández, B.
Journal:
Journal of the American Society for Mass Spectrometry

ISSN: 1879-1123,  1044-0305

Year of publication: 2015

Volume: 26

Issue: 2

Pages: 305-314

Type: Article

DOI: 10.1007/S13361-014-1022-9 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus