Dependent binary relevance models for multi-label classification

  1. Montañes, E.
  2. Senge, R.
  3. Barranquero, J.
  4. Ramón Quevedo, J.
  5. José Del Coz, J.
  6. Hüllermeier, E.
Revue:
Pattern Recognition

ISSN: 0031-3203

Année de publication: 2014

Volumen: 47

Número: 3

Pages: 1494-1508

Type: Communication dans un congrès

DOI: 10.1016/J.PATCOG.2013.09.029 GOOGLE SCHOLAR