Material characterization using a millimeter wave portal-based imaging system for security screening

  1. Alvarez, Y.
  2. Las-Heras, F.
  3. Gonzalez-Valdes, B.
  4. Martinez-Lorenzo, J.A.
  5. Rappaport, C.M.
Konferenzberichte:
2013 IEEE International Conference on Technologies for Homeland Security, HST 2013

ISBN: 9781479915354

Datum der Publikation: 2013

Seiten: 511-516

Art: Konferenz-Beitrag

DOI: 10.1109/THS.2013.6699056 GOOGLE SCHOLAR