Material characterization using a millimeter wave portal-based imaging system for security screening
- Alvarez, Y.
- Las-Heras, F.
- Gonzalez-Valdes, B.
- Martinez-Lorenzo, J.A.
- Rappaport, C.M.
Konferenzberichte:
2013 IEEE International Conference on Technologies for Homeland Security, HST 2013
ISBN: 9781479915354
Datum der Publikation: 2013
Seiten: 511-516
Art: Konferenz-Beitrag