EMI radiated noise measurement system using the source reconstruction technique

  1. Hernando, M.M.
  2. Fernández, A.
  3. Arias, M.
  4. Rodríguez, M.
  5. Álvarez, Y.
  6. Las-Heras, F.
Revue:
IEEE Transactions on Industrial Electronics

ISSN: 0278-0046

Année de publication: 2008

Volumen: 55

Número: 9

Pages: 3258-3265

Type: Communication dans un congrès

DOI: 10.1109/TIE.2008.928042 GOOGLE SCHOLAR
La source de données: Scopus