A low-cost system for flatness monitoring in metal processes

  1. Lopera, J.M.
  2. Villegas, P.J.
  3. Linera, F.F.
  4. Hernández-Magadan, F.
  5. Martin-Ramos, J.
  6. Díaz, J.
  7. Vecino, G.
  8. Rendueles, J.L.
Aktak:
Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

ISSN: 0197-2618

ISBN: 9781424403646

Argitalpen urtea: 2006

Alea: 1

Orrialdeak: 528-533

Mota: Biltzar ekarpena

DOI: 10.1109/IAS.2006.256570 GOOGLE SCHOLAR
Datuen iturria: Scopus