Matching conducted EMI to International standards
- Dos Reis, F.S.
- De Lima, J.C.M.
- Canalli, V.M.
- Pomilio, J.A.
- Sebastián, J.
- Uceda, J.
Proceedings:
PESC Record - IEEE Annual Power Electronics Specialists Conference
ISSN: 0275-9306
Year of publication: 2002
Volume: 1
Pages: 388-393
Type: Conference paper