Flatness measurement system based on a nonlinear optical triangulation technique

  1. Garcia, D.F.
  2. Garcia, M.
  3. Obeso, F.
  4. Fernandez, V.
Aldizkaria:
IEEE Transactions on Instrumentation and Measurement

ISSN: 0018-9456

Argitalpen urtea: 2002

Alea: 51

Zenbakia: 2

Orrialdeak: 188-195

Mota: Artikulua

DOI: 10.1109/19.997810 GOOGLE SCHOLAR
Datuen iturria: Scopus