Enhanced secondary electron yield from oxidized regions on amorphous carbon films studied by x-ray spectromicroscopy

  1. Diaz, J.
  2. Anders, S.
  3. Cossy-Favre, A.
  4. Samant, M.
  5. Stöhr, J.
Aldizkaria:
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

ISSN: 0734-2101

Argitalpen urtea: 1999

Alea: 17

Zenbakia: 5

Orrialdeak: 2737-2740

Mota: Artikulua

DOI: 10.1116/1.581938 GOOGLE SCHOLAR

Garapen Iraunkorreko Helburuak

Datuen iturria: Scopus