Highly sensitive magneto-optic transverse Kerr effect measurement system for the detection of perpendicular anisotropy and magnetic phases in thin films

  1. Corrales, J.A.
  2. Rivas, M.
  3. F-Calleja, J.
  4. Iglesias, I.
  5. Contreras, M.C.
Revue:
Journal of Applied Physics

ISSN: 0021-8979

Année de publication: 1996

Volumen: 79

Número: 8 PART 2A

Pages: 5217-5219

Type: Article