IGNACIO
ALVAREZ GARCIA
Profesor Titular de Universidad
JOSE MARIA
ENGUITA GONZALEZ
Profesor Titular de Universidad
JOSE MARIA ENGUITA GONZALEZ-rekin lankidetzan egindako argitalpenak (27)
2018
-
Multi-kernel deconvolution for contrast improvement in a full field imaging system with engineered PSFs using conical diffraction
Optics and Lasers in Engineering, Vol. 100, pp. 161-169
2016
-
Algebra lineal básica para visión por computador
Conceptos y métodos en visión por computador (Grupo de Visión del Comité Español de Automática (CEA)), pp. 337-348
-
Geometría proyectiva para visión 3D
Conceptos y métodos en visión por computador (Grupo de Visión del Comité Español de Automática (CEA)), pp. 349-358
-
Procesamiento morfológico
Conceptos y métodos en visión por computador (Grupo de Visión del Comité Español de Automática (CEA)), pp. 77-98
-
Theoretical design of a depolarized interferometric fiber-optic gyroscope (IFOG) on SMF-28 single-mode standard optical fiber based on closed-loop sinusoidal phase modulation with serrodyne feedback phase modulation using simulation tools for tactical and industrial grade applications
Sensors (Switzerland), Vol. 16, Núm. 5
-
Visión 3D: Estereoscopía
Conceptos y métodos en visión por computador (Grupo de Visión del Comité Español de Automática (CEA)), pp. 247-264
2015
-
Conical diffraction thin crystal device on full-scene images
Journal of Optics (United Kingdom), Vol. 17, Núm. 12
2013
-
Automatic area based registration method and its application to the surface inspection of steel industry products
Proceedings of SPIE - The International Society for Optical Engineering
-
In-situ waviness characterization of metal plates by a lateral shearing interferometric profilometer
Sensors (Switzerland), Vol. 13, Núm. 4, pp. 4906-4921
2012
-
In situ 3D profilometry of rough objects with a lateral shearing interferometry range finder
Optics and Lasers in Engineering, Vol. 50, Núm. 11, pp. 1559-1567
2011
-
Fringe pattern characterization by OPD analysis in a lateral shearing interferometric profilometer
Proceedings of SPIE - The International Society for Optical Engineering
2010
-
Common-path two-wavelength interferometer with submicron precision for profile measurements in on-line applications
Optical Engineering, Vol. 49, Núm. 2
2009
-
Common-path two-wavelength interferometer with sub-micron precision for profile measurements in on-line applications
Proceedings of SPIE - The International Society for Optical Engineering
-
Industrial on-line surface defects detection in continuous casting hot slabs
Proceedings of SPIE - The International Society for Optical Engineering
-
On-line metrology with conoscopic holography: Beyond triangulation
Sensors, Vol. 9, Núm. 9, pp. 7021-7037
-
Toward extended range sub-micron Conoscopic Holography profilometers, using multiple wavelengths and phase measurement
Proceedings of SPIE - The International Society for Optical Engineering
2008
-
On-line submicron profile measurements from safe distances with conoscopic holography: Feasibility and potential problems
Optical Engineering, Vol. 47, Núm. 2
2007
-
Improving signal processing performance on a conoscopic holography-based profilometer with phase-shifting interferometry algorithms
Optical Engineering, Vol. 46, Núm. 9
2006
-
Conoscopic holography based profilometers for defect inspection: Improvements in speed, resolution and noise reduction
Proceedings of SPIE - The International Society for Optical Engineering
-
Conoscopic holography-based long-standoff profilometer for surface inspection in adverse environment
Optical Engineering, Vol. 45, Núm. 7