Decoupling Effects for Dynamic Switching Stress in SiC MOSFETs

  1. Gomez, A.A.
  2. Garcia-Mere, J.R.
  3. Rodriguez, A.
  4. Rodriguez, J.
  5. Jimenez-Guerra, C.
  6. Roig-Guitart, J.
Journal:
IEEE Transactions on Industry Applications

ISSN: 1939-9367,  0093-9994

Year of publication: 2025

Type: Article

DOI: 10.1109/TIA.2025.3534183 GOOGLE SCHOLAR lock_openOpen access editor
Data source: Scopus