Decoupling Effects for Dynamic Switching Stress in SiC MOSFETs

  1. Gómez,A.A.
  2. García-Meré,J.R.
  3. Rodríguez,A.
  4. Rodríguez,J.
  5. Jiménez-Guerra,C.
  6. Roig-Guitart,J.
Journal:
IEEE Transactions on Industry Applications

ISSN: 1939-9367,  0093-9994

Year of publication: 2025

Volume: 61

Issue: 3

Pages: 4079-4088

Type: Article

DOI: 10.1109/TIA.2025.3534183 GOOGLE SCHOLAR
Data source: Scopus