Scanning tunneling microscopy of ultrathin indium intercalated between graphene and SiC using confinement heteroepitaxy
- Pham, V.D.
- González, C.
- Dappe, Y.J.
- Dong, C.
- Robinson, J.A.
- Trampert, A.
- Engel-Herbert, R.
Journal:
Applied Physics Letters
ISSN: 0003-6951
Year of publication: 2024
Volume: 125
Issue: 18
Type: Article