Crystal-field effects at the TiO2-SiO2 interface as observed by X-ray absorption spectroscopy
- Soriano, L.
- Fuentes, G.G.
- Quirós, C.
- Trigo, J.F.
- Sanz, J.M.
- Bressler, P.R.
- González-Elipe, A.R.
ISSN: 0743-7463
Year of publication: 2000
Volume: 16
Issue: 17
Pages: 7066-7069
Type: Article