A Test Circuit for GaN HEMTs Dynamic Characterization in Power Electronics Applications

  1. Martinez, P.J.
  2. Miaja, P.F.
  3. Maset, E.
  4. Rodriguez, J.
Journal:
IEEE Journal of Emerging and Selected Topics in Power Electronics

ISSN: 2168-6785,  2168-6777

Year of publication: 2019

Volume: 7

Issue: 3

Pages: 1456-1464

Type: Article

DOI: 10.1109/JESTPE.2019.2912130 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus