Influence of the hydrogen contained in amorphous silicon thin films on a pulsed radiofrequency argon glow discharge coupled to time of flight mass spectrometry. Comparison with the addition of hydrogen as discharge gas
- Sánchez, P.
- Alberts, D.
- Fernández, B.
- Menéndez, A.
- Pereiro, R.
- Sanz-Medel, A.
ISSN: 0267-9477, 1364-5544
Datum der Publikation: 2012
Ausgabe: 27
Nummer: 1
Seiten: 71-79
Art: Artikel