On-line submicron profile measurements from safe distances with conoscopic holography: Feasibility and potential problems

  1. Álvarez, I.
  2. Enguita, J.M.
  3. Marina, J.
  4. Fraga, C.
Zeitschrift:
Optical Engineering

ISSN: 1560-2303,  0091-3286

Datum der Publikation: 2008

Ausgabe: 47

Nummer: 2

Art: Artikel

DOI: 10.1117/1.2844713 GOOGLE SCHOLAR
Datenquelle: Scopus