Conoscopic holography-based long-standoff profilometer for surface inspection in adverse environment
- Enguita, J.M.
- Álvarez, I.
- Fraga, C.
- Marina, J.
- Fenández, Y.
- Sirat, G.
ISSN: 0091-3286, 1560-2303
Année de publication: 2006
Volumen: 45
Número: 7
Type: Article