Conoscopic holography-based long-standoff profilometer for surface inspection in adverse environment

  1. Enguita, J.M.
  2. Álvarez, I.
  3. Fraga, C.
  4. Marina, J.
  5. Fenández, Y.
  6. Sirat, G.
Aldizkaria:
Optical Engineering

ISSN: 0091-3286,  1560-2303

Argitalpen urtea: 2006

Alea: 45

Zenbakia: 7

Mota: Artikulua

DOI: 10.1117/1.2219097 GOOGLE SCHOLAR

Garapen Iraunkorreko Helburuak

Datuen iturria: Scopus