Conoscopic holography-based long-standoff profilometer for surface inspection in adverse environment

  1. Enguita, J.M.
  2. Álvarez, I.
  3. Fraga, C.
  4. Marina, J.
  5. Fenández, Y.
  6. Sirat, G.
Journal:
Optical Engineering

ISSN: 0091-3286,  1560-2303

Year of publication: 2006

Volume: 45

Issue: 7

Type: Article

DOI: 10.1117/1.2219097 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus